Dr. Said Hamdioui
Hamdioui received the MSEE and PhD degrees (both with honors) from the Delft University of Technology (TUDelft), Delft, The Netherlands. He is currently leading In-Memory-Computing and co-leading Dependable-Nano Computing research activities within the Computer Engineering Laboratory (CE-Lab) of TUDelft. Prior to joining TUDelft, Hamdioui spent about seven years within industry including Microprocessor Products Group at Intel Corporation (Califorina, USA), IP and Yield Group at Philips Semiconductors R&D (Crolles, France) and DSP design group at Philips/ NXP Semiconductors (Nijmegen, The Netherlands). His research focuses on two domains: Dependable CMOS nano-computing (including Reliability, Testability, Hardware Security) and emerging technologies and computing paradigms (including 3D stacked ICs, memristors for logic and storage, in-memory-computing for big-data applications).
Hamdioui owns one patent and has published one book and co-authored over 170 conference and journal papers. He has consulted for many companies (such as Intel, ST, Altera, Atmel, Renesas, …) in the area of memory testing and has collaborated with many industry/research partners (examples are Intel, IMEC, NXP, Intrinsic ID, DS2, ST Microelectronics, Cadence, Politic di Torino, etc) in the field of dependable nano-computimng and emerging technologies. He is strongly involved in the international community as a member of organizing committees (e.g., general chair, program chair, etc) or a member of the technical program committees of the leading conferences. He delivered dozens of keynote speeches, distinguished lectures, and invited presentations and tutorial at major international forums/conferences/schools and at leading semiconductor companies. Hamdioui is a Senior member of the IEEE, Associate Editor of IEEE Transactions on VLSI Systems (TVLSI), and he serves on the editorial board of IEEE Design & Test, and of the Journal of Electronic Testing: Theory and Applications (JETTA). He is also member of AENEAS/ENIAC Scientific Committee Council (AENEAS =Association for European NanoElectronics Activities).
Hamdioui is the recipient of the European Design Automation Association Outstanding Dissertation Award 2001; the 2015 HiPEAC Technology Transfer Award, Best Paper Award at 33rd IEEE International Conference on Computer Design ICCD 2015, Best paper Award at International conference on Design and Test of Integrated Systems in the nano-era DTIS 2011, IEEE Nano and Nano Korea award at IEEE NANO 2010, Intel informal Award for developed test methods for embedded caches in Itanuim processors. In addition, he is a leading member of Cadence Academic Network on Dependability and Design-for-Testability, and he was nominated for The Young Academy of the Royal Netherlands Academy of Arts and Sciences (KNAW) in 2009.
Microelectronics (Master) (1)
VLSI Test Technology & Reliabillity