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Home Courses VLSI Test Technology & Reliabillity Course materials Lectures Module 14

Module 14

Course subject(s) Semiconductor Reliability

This module about semiconductor reliability starts with explanations on the concepts and definitions of reliability. By giving motivations to make use of this concept, he importance of reliability is underlined. Next, failure mechanisms and its classification are explained. Thereafter, several ways of reliability testing are elaborated. The module is closed by giving an explanation on future challenges in the field of reliability testing.

The material treated in this module is not described in the textbook.

Module 14 Reliability
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VLSI Test Technology & Reliabillity by TU Delft OpenCourseWare is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.
Based on a work at https://ocw.tudelft.nl/courses/vlsi-test-technology-reliabillity/.
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