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Home Courses VLSI Test Technology & Reliabillity Course materials Lectures Module 05

Module 05

Course subject(s) Testability Measures

This module deals with testability measures and Automated Test Pattern Generation (ATPG) for combinational circuits. It starts with the definition and purpose of testability. Thereafter, the Sandia Controllability and Observability Analysis Program (SCOAP) is introduced together with some definitions and calculations. Both combinational and sequential SCOAP measures are elaborated. It is also explained that SCOAP can be used to predict the length of test vector sets.

Corresponding to material treated in this module come the following textbook chapters: Chapter 6.

Module 5 Testability Measures

VLSI Test Technology & Reliabillity by TU Delft OpenCourseWare is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.
Based on a work at https://ocw.tudelft.nl/courses/vlsi-test-technology-reliabillity/.

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