Subjects

This page contains a short introduction and the lecture slides of each week.

The main goals of the course are:

• Describe the importance of VLSI testing and reliability, its impact on the total cost and the quality of the designed product.
• Point out the strong correlation between VLSI Design and Test
• Describe the silicon/ transistor/ interconnect defect mechanisms and the way they behave at the electrical/functional level and how they are tested using fault models and test algorithms
• Define the different test methodologies for logic and sequential circuits, their advantages, disadvantages, cost, limitations, etc.
• Define the different “Design-for-Testability DFT” methodologies, their advantages, disadvantages, cost and limitations
• State the trends and challenges in VLSI Testing and Reliability
• Be able to develop test algorithms and DFT techniques for digital circuits
• Be able to better understand the “weaknesses” of digital systems and do research on VLSI Test Technology
• Become a better VLSI designer, a better test engineer/ product engineer