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Home Courses VLSI Test Technology & Reliabillity Course materials Lectures Module 01

Module 01

Course subject(s) Introduction

This first module is a course introduction. After a brief introduction of the lecturer, the importance of VLSI test technology and reliability for integrated circuits is discussed. An introduction to IC tests is given. Thereafter, the topic of Design for Testability (DFT) is elaborated. After an explanation on manufacturing test flow, the trends in System-on-a-Chip (SoC) design and test are given.

Corresponding to material treated in this lecture come the following textbook chapters: Chapter 1, Chapter 3.1.5, 3.2, 3.3.

Module 1 Introduction
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VLSI Test Technology & Reliabillity by TU Delft OpenCourseWare is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.
Based on a work at https://ocw.tudelft.nl/courses/vlsi-test-technology-reliabillity/.
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