This module is about current (IDDQ) testing. First, the concept of current testing is described together with the positive and negative effects. After this introduction, vector generation for IDDQ tests is explained. Then, practical aspects like instrumentation difficulties, IDDQ testing effectiveness and the limitations of the tests are elaborated. Also, the concept of Delta IDDQ testing is discussed and compared with the normal current testing.
Corresponding to material treated in this module come the following textbook chapters: Chapter 13.
VLSI Test Technology & Reliabillity by TU Delft OpenCourseWare is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.
Based on a work at https://ocw.tudelft.nl/courses/vlsi-test-technology-reliabillity/.