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Home Courses VLSI Test Technology & Reliabillity Course materials Lectures Module 11

Module 11

Course subject(s) Digital DFT and Scan Design

 

The topics in this module are digital design for testability (DFT) and scan design. Distinction is made between two DFT methods: ad-hoc and structured. These two methods are then compared. Thereafter, the concept of scan design is thoroughly elaborated together with its advantages and disadvantages. Also, the partial-scan is introduced and compared with the full-scan. Lastly, the concept of scan-hold-flip-flop (SHFF) is discussed.

Corresponding to material treated in this module come the following textbook chapters: Chapter 14.

 

Module 11 Digital DFT and Scan Design
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