The topics in this module are digital design for testability (DFT) and scan design. Distinction is made between two DFT methods: ad-hoc and structured. These two methods are then compared. Thereafter, the concept of scan design is thoroughly elaborated together with its advantages and disadvantages. Also, the partial-scan is introduced and compared with the full-scan. Lastly, the concept of scan-hold-flip-flop (SHFF) is discussed.

Corresponding to material treated in this module come the following textbook chapters: Chapter 14.