Module 11

Course subject(s) Digital DFT and Scan Design

 

The topics in this module are digital design for testability (DFT) and scan design. Distinction is made between two DFT methods: ad-hoc and structured. These two methods are then compared. Thereafter, the concept of scan design is thoroughly elaborated together with its advantages and disadvantages. Also, the partial-scan is introduced and compared with the full-scan. Lastly, the concept of scan-hold-flip-flop (SHFF) is discussed.

Corresponding to material treated in this module come the following textbook chapters: Chapter 14.

 

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VLSI Test Technology & Reliabillity by TU Delft OpenCourseWare is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.
Based on a work at https://ocw.tudelft.nl/courses/vlsi-test-technology-reliabillity/.
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