Module 12
Course subject(s)
Built-In-Self Test
In this module, the concept and architecture of the Built-In-Self Test (BIST) is elaborated. After an introduction on this test, a more in-depth view is given to the BIST hierarchy and building blocks. Thereafter, the concept of aliasing in BIST is explained. Also, (memory) BIST costs are discussed. The module is closed with a summary on the advantages and disadvantages of BIST.
Corresponding to material treated in this module come the following textbook chapters: Chapter 15.
VLSI Test Technology & Reliabillity by TU Delft OpenCourseWare is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.
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