Home Courses VLSI Test Technology & Reliabillity Course materials Lectures Module 02

Module 02

Course subject(s) VLSI Test Process and Test Equipment

In this module, the various stages of testing are explained. Thereafter, the difference between parametric and functional/structural testing is given. Also, a basic concept about test program generation is elaborated. Finally, Automatic Test Equipment (ATE) test costs and ways of reduction are discussed.

Corresponding to material treated in this module come the following textbook chapters: Chapter 2.

Module 2 VLSI Test Process and ATE
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