Module 02

Course subject(s) VLSI Test Process and Test Equipment

In this module, the various stages of testing are explained. Thereafter, the difference between parametric and functional/structural testing is given. Also, a basic concept about test program generation is elaborated. Finally, Automatic Test Equipment (ATE) test costs and ways of reduction are discussed.

Corresponding to material treated in this module come the following textbook chapters: Chapter 2.

Creative Commons License
VLSI Test Technology & Reliabillity by TU Delft OpenCourseWare is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.
Based on a work at
Back to top