Module 03

Course subject(s) Fault Modeling

In this module, the concept of fault modeling is explained. The difference between defect and fault models is given. Common defects are described, as well as common used fault models. Thereafter, it is explained how to define the fault set of a combinational circuit. Definitions like fault equivalence and fault dominance are given and it is explained how to reduce the fault set using these concepts.

Corresponding to material treated in this module come the following textbook chapters: Chapter 4.

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VLSI Test Technology & Reliabillity by TU Delft OpenCourseWare is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.
Based on a work at https://ocw.tudelft.nl/courses/vlsi-test-technology-reliabillity/.
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