Home Courses VLSI Test Technology & Reliabillity Course materials Lectures Module 06

Module 06

Course subject(s) Combinational Circuit Testing

In this module, Automated Test Pattern Generation (ATPG) for combinational circuits is elaborated. First, different algorithms and representations are discussed, followed by the concept of redundancy identification.

Corresponding to material treated in this module come the following textbook chapters: Chapter 7.

Module 6 Combinational Circuit Testing
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