Module 07
Course subject(s)
Sequential Circuit Testing
This module continues with ATPG: sequential circuit ATPG. The module is started with a problem description, followed by the methods for sequential circuit ATPG. The concept of time-frame expansion is explained thoroughly. Thereafter, simulation-based sequential circuit ATPG is discussed.
Corresponding to material treated in this module come the following textbook chapters: Chapter 8.
VLSI Test Technology & Reliabillity by TU Delft OpenCourseWare is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.
Based on a work at https://ocw.tudelft.nl/courses/vlsi-test-technology-reliabillity/.