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Home Courses VLSI Test Technology & Reliabillity Course materials Lectures Module 07

Module 07

Course subject(s) Sequential Circuit Testing

This module continues with ATPG: sequential circuit ATPG. The module is started with a problem description, followed by the methods for sequential circuit ATPG. The concept of time-frame expansion is explained thoroughly. Thereafter, simulation-based sequential circuit ATPG is discussed.

Corresponding to material treated in this module come the following textbook chapters: Chapter 8.

Module 7 Sequential Circuit Testing
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