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Home Courses VLSI Test Technology & Reliabillity Course materials Lectures Module 08

Module 08

Course subject(s) Memory Testing

This module is about memory testing. After a motivation on why this topic is important, the basics of memory devices are given. Then, the architecture of semiconductor memory is elaborated and functional fault models are given. Lastly, memory test developments are discussed and some well-known memory tests are explained.

Corresponding to material treated in this module come the following textbook chapters: Chapter 9.

Module 8 Memory Testing
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