Assignments

Course subject(s) Exercises

In order to test yourself on the topics treated in this course on VLSI test technology and reliability, two assignments have been made available. The assignments are given below, along with a brief description of their content.

Assignment 1

This first assignment consists of 9 questions and another optional bonus question. The first half of the material treated in the lectures is assumed to be known (up till ~ Chapter 8).

Assignment 2

The second assignment corresponds to the second half of the course material treated in the lectures. A total of 8 questions are asked in this assignment. The main topics are delay testing and scan design.

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VLSI Test Technology & Reliabillity by TU Delft OpenCourseWare is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.
Based on a work at https://ocw.tudelft.nl/courses/vlsi-test-technology-reliabillity/.
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