Lectures

• Module 11

  Subject(s) Digital DFT and Scan Design
  

• Module 12

  Subject(s) Built-In-Self Test
  

• Module 13

  Subject(s) Boundary Scan Standard
  

• Module 14

  Subject(s) Semiconductor Reliability
  

VLSI Test Technology & Reliabillity by TU Delft OpenCourseWare is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.
Based on a work at https://ocw.tudelft.nl/courses/vlsi-test-technology-reliabillity/.