Lectures

• Module 01

  Subject(s) Introduction
  

• Module 02

  Subject(s) VLSI Test Process and Test Equipment
  

• Module 03

  Subject(s) Fault Modeling
  

• Module 04

  Subject(s) Logic and Fault Simulation
  

• Module 05

  Subject(s) Testability Measures
  

• Module 06

  Subject(s) Combinational Circuit Testing
  

• Module 07

  Subject(s) Sequential Circuit Testing
  

• Module 08

  Subject(s) Memory Testing
  

• Module 09

  Subject(s) Delay Testing
  

• Module 10

  Subject(s) Current testing
  

VLSI Test Technology & Reliabillity by TU Delft OpenCourseWare is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.
Based on a work at https://ocw.tudelft.nl/courses/vlsi-test-technology-reliabillity/.